Digital Library
Search: "[ keyword: Embedded Software Testing ]" (2)
A Test Case Generation Techniques Based on J2ME Platform
Sang Il Kim , Myong Ki Roh , Sung Yul Rhew The KIPS Transactions:PartD,
Vol. 13, No. 2, pp. 215-222,
Apr.
2006
10.3745/KIPSTD.2006.13.2.215
10.3745/KIPSTD.2006.13.2.215
CRESTIVE-DX: Design and Implementation of Distrusted Concolic Testing Tool for Embedded Software
Hyerin Leem, Hansol Choe, Hyorim Kim, Shin Hong KIPS Transactions on Software and Data Engineering,
Vol. 9, No. 8, pp. 229-234,
Aug.
2020
https://doi.org/10.3745/KTSDE.2020.9.8.229
Keywords: Concolic Testing, Test Generation, Embedded Software Testing, Symbolic Execution, Automated Testing
https://doi.org/10.3745/KTSDE.2020.9.8.229
Keywords: Concolic Testing, Test Generation, Embedded Software Testing, Symbolic Execution, Automated Testing
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Vol. 13, 2024
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Vol. 12, 2023
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Vol. 11, 2022
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Vol. 10, 2021
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Vol. 9, 2020
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Vol. 8, 2019
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Vol. 7, 2018
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Vol. 6, 2017
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Vol. 5, 2016
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Vol. 3, 2014
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Vol. 2, 2013
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Vol. 1, 2012
Old Journals
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All publications of KTSDE is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.
KTSDE is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).
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